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  • SRC 1999 Publications

    1. C. Y. Robert Wu, F. Z. Chen, D. L. Judge, Xin-Min Hua and J. Caldwell, Temperature-Dependent Absorption Strengths for Transitions from the Ground State to the Mutually Perturbed A 1 II (v=1) and d 3 1 (v = 5) States of CO, Journal of Chemical Physics 110 (1), 267-273 (1999).

    2. Jingxi Sun, Dong Ju Seo, W. L. O’Brien, F. J. Himpsel, A. B. Ellis, and T. F. Kuech, Chemical Bonding and Electronic Properties of SeS2-Treated GaAs (100), Journal of Applied Physics 85 (2), 969-977 (1999).

    3. C. Y. Robert Wu, F. Z. Chen and D. L. Judge, Temperature-Dependent Photoabsorption Cross Sections of OCS in the 2000-2600 A Region, Journal of Quantitative Spectroscopy & Radiative Transfer, 61 (2), 265-271 (1999).

    4. C. G. Olson and D. W. Lynch, Olson and Lynch Reply, Physical Review Letters 82 (3), 671 (1999).

    5. C. D Caldwell, M. O. Krause, R. D. Cowan, A. Menzel, S. B. Whitfield, S. Hallman, S. P. Frigo, and M. C. Severson, Inner-shell Photoexcitation in an Open-shell Atom: The Cl 2p ? ns, md Spectrum as a Case Study, Physical Review A 59 (2), R926-R929 (1999).

    6. J. J. Joyce, A. J. Arko, J. L. Sarrao, and K. S. Graham, Photemission from YbInCu4: Testing the Single Impurity Model, Philosophical Magazine B 79 (1), 1-8 (1999).

    7. Gelsomina De Stasio, B. Gilbert, L. Perfetti, R. Hansen, D. Mercanti, M. T. Ciotti, R. Andres, V. E. White, P. Perfetti, and G. Margaritondo, Cell Ashing for Trace Element Analysis: A New Approach Based on Ultraviolet/Ozone, Analytical Biochemistry 266, 174-180 (1999).

    8. J. He, Y. Ba, C. I. Ratcliffe, J. A. Ripmeester, D. D. Klug, and J. S. Tse, The Nature of Encapsulated Silicon Nanoclusters in Zeolite Y, Applied Physics Letters 74 (6), 830-832 (1999).

    9. C. M. Evans, R. Reininger, and G. L. Findley, Subthreshold Photoionization Spectra of CH3I Perturbed by SF6, Chemical Physics 241, 239-346 (1999).

    10. John J. Neville, Tolek Tyliszczak, Adam P. Hitchcock, Astrid Jurgensen, and Ron G. Cavell, P 1 s Spectroscopy of SPF3: Spectral Assignments Aided By Angle-Resolved Photodissociation, Chemical Physics Letters 300 (3-4), 451-459 (1999).

    11. Gelsomina De Stasio, Luca Perfetti, B. Gilbert, O. Fauchoux, M. Capozi, P. Perfetti, G.Margaritondo, and B. P. Tonner, MEPHISTO Spectromicroscope Reaches 20 nm Lateral Resolution, Review of Scientific Instruments 70 (3), 1740-1742 (1999).

    12. S. G. Walton, J. C. Tucek, and R. L. Champion, Low Energy, Ion-induced Electron and Ion Emission From Stainless Steel: The Effect of Oxygen Coverage and the Implications for Discharge Modeling, Journal of Applied Physics 85 (3), 1832-1837 (1999).

    13. F. J. Himpsel, Mirrors for Electrons, Science Vol 283 (5408), 1655 (1999).

    14. J. J. Paggel, T. Miller, T. –C. Chiang, Quantum-Well States as Fabry-Perot Modes in a Thin-Film Electron Interferometer, Science Vol 283 (5408), 1709-1711 (1999).

    15. J. D. Denlinger, G. –H. Gweon, J. W. Allen, C. G. Olson, J. Marcus, C. Schlenker, and L.-S. Hsu, Non-Fermi-Liquid Single Particle Line Shape of the Quasi-One-Dimensional Non-CDW Metal Li0.9Mo6O17: Comparison to the Luttinger Liquid, Physical Review Letters 82 (12), 2540-2543 (1999).

    16. F. Zwick, H. Berger, M. Grioni, G. Margaritondo, L. Forro, J. LaVeigne, D. B. Tanner, and M. Onellion, Coexisting One-Dimensional and Three-Dimensional Spectral Signatures in TaTe4, Physical Review B 59 (11), 7762-7766 (1999).

    17. I. Vobornik, H. Berger, D. Pavuna, M. Onellion, G. Margaritondo, F. Rullier-Albenque, L. Forro, and M. Grioni, Spectroscopic Signatures of Defect-Induced Pair Breaking in Bi2Sr2CaCu2O8=x, Physical Review Letters 82 (15), 3128-3131 (12 April 1999).

    18. Juan Carlos Campuzano, H. Ding, M. R. Norman, and M. Randeria, Destruction of the Fermi Surface in Underdoped Cuprates, Physica B 259-261 (1999), 517-521.

    19. J. Mesot, M. R. Norman, H. Ding, and J. C. Campuzano, Hot Spots on the Fermi Surface of Bi2Sr2CaCu2O8+d : Stripes Versus Superstructure, Physical Review Letters 82 (12), 2618, (22 March 1999).

    20. J.-S. Kang, Y. Inada, Y. Æ nuki, C. G. Olson, S. K. Kwon, and B. I. Min, Photoemission Lineshape of CeNiSn Near the Fermi Level, Physica B 259-261 (1999), 1116-1117.

    21. A. J. Arko, J. J. Joyce, J. Sarrao, J. D. Thompson, L. Morales, Z. Fisk, A. Wojakowski, and T. Cichorek, Strongly Correlated f-Electron Systems: A PES Study, Journal of Superconductivity, 12 (1), 175-179 (Feb. 1999).

    22. F. Z. Chen, D. L. Judge, C. Y. Robert Wu, and John Caldwell, Low and Room Temperature Photoabsorption Cross Sections of NH3 in the UV Region, Planetary and Space Science, 47 (1-2), 261-266 (Jan-Feb 1999).

    23. F. Zwick, M. Grioni, M. Onellion, L. K. Montgomery, and G. Margaritondo, Experimental Spectral Signatures of 1 D Metals, Physica B 265 (1-4), 160-163 (Apr. 1999).

    24. Geoffrey W. Reynolds and James W. Taylor, Factors Contributing to Sidewall Roughness in a Positive-tone, Chemically Amplified Resist Exposed by X-ray Lithography, Journal of Vac. Sci. Technology B 17 (2), 334-344, (Mar/Apr 1999).

    25. F. J. Himpsel, K. N. Altmann, G. J. Mankey, J. E. Ortega, and D. Y. Petrovykh, Electronic States in Magnetic Nanostructures, Journal of Magnetism & Magnetic Materials 200 (1-3), 456-469 (October, 1999).

    26. A. Bzowski, M. Kuhn, T. K. Sham, J. A. Rodriguez and J. Hrbek, Electronic Structure of Au-Ag Bimetallics: Surface Alloying on Ru(001), Physical Review B 59 (20) 13379-13393 (15 May 1999-II).

    27. B. P. Tonner, T. Droubay, J. Denlinger, W. Meyer-Ilse, T. Warwick, J. Rothe, E. Kneedler. K. Pecher, K. Nealson, and T. Grundl, Soft X-ray, Spectroscopy and Imaging of Interfacial Chemistry in Environmental Specimens, Surface and Interface Analysis 27, 247-258 (1999).

    28. S. J. Naftel, I. Coulthard, and T. K. Sham, Electronic Structure of Nickel Silicide in Subhalf-Micron Lines and Blanket Films: An X-ray Absorption Fine Structures Study at the Ni and SiÐ 3,2 Edge, Applied Physics Letters 74 (19), 2893-2895 (May 10, 1999).

    29. W. Yun, B. Lai, Z. Cai, J. Maser, D. Legnini, E. Gluskin, Z. Chen, A. A. Krasnoperova, Y. Vladimirsky, F. Cerrina, E. Di Fabrizio, M. Gentili, Nanometer Focusing of Hard X-rays by Phase Zone Plates, Review of Scientific Instruments 70 (5), 2238-2241 (May 1999).

    30. J. C. Aubry, T. Tyliszczak, A. P. Hitchcock, J.-M. Baribeau and T. E. Jackman, First-Shell Bond Lengths in SixGe1-x Crystalline Alloys, Physical Review B 59 (20), 12872- 12883 (May 15, 1999).

    31. Tao Lin, M. M. Schwickert, M. A. Tomas, H. Chen, and G. R. Harp, X-ray Magnetic-Circular-Dichroism Study of Ni/Fe (001) Multilayers, Physical Review B 59 (21), 13911-13918 (June 1, 1999).

    32. R. Treusch, F. J. Himpsel, S. Kakar, L. J. Terminello, C. Heske, T. van Buuren, V. V. Dinh, H. W. Lee, K. Pakbaz, G. Fox, and I. Jimenez, X-ray Photoemission and Photoabsorption of Organic Electroluminescent Materials, Journal of Applied Physics 86 (1) 88-93 (1-July-1999).

    33. Bing Lu, Paul M. Dentinger, James W. Taylor, Gilbert D. Feke, Dan Hessman, Qiang Wu, and Robert D. Grober, Evaluation of Photoacid Generators in Chemically Amplified Resists for X-ray Lithography using an On-wafer Photoacid Determination Technique, Part of the SPIE Conference on Emerging Lithographic Technologies III, Santa Clara, CA, SPIE Volume 3676, 466-472 (March 1999).

    34. Olga Vladimirsky, Niru Dandekar, Wenlong Jiang, Quinn Leonard, Klaus Simon, Srinivas Bollepalli, Yuli Vladimirsky, and James W. Taylor, Sub-100 nm Imaging in X-ray Lithography, Part of the SPIE Conference on Emerging Lithographic Technologies III, Santa Clara, CA, SPIE Volume 3676, 478-484 (March 1999).

    35. Quinn Leonard, Jaz Bansel, Lei Yang, Olga Vladimirsky, Srinivas Bollepali, Mumit Khan, Yuli Vladimirsky, Franco Cerrina, James W. Taylor, Klaus Simon, Lynn Rathbun and Richard Tiberio, X-ray Mask Fabrication at CXrL, Part of the SPIE Conference on Emerging Lithographic Technologies III, Santa Clara, CA, SPIE Volume 3676, 56-62 (March 1999).

    36. R. Selzer, J. Heaton, Y. Vladimirsky, and K. Simon, X-ray Lithography, Part of the SPIE Conference on Emerging Lithographic Technologies III, Santa Clara, CA, SPIE Volume 3676, 10-13 (March 1999).

    37. N. Krasnoperov, J. Bansel, O. Vladimirsky, J. Wallace, Y. Vladimirsky, and F. Cerrina, Heating of X-ray Masks During E-beam Writing, Part of the SPIE Conference on Emerging Lithographic Technologies III, Santa Clara, CA, SPIE Volume 3676, 106-116 (March 1999).

    38. H. H. Solak, D. He, W. Li, F. Cerrina, B. H. Sohn, X. Yang, P. Nealey, EUV Interferometric Lithography for Resist Characterization, Part of the SPIE Conference on Emerging Lithographic Technologies III, Santa Clara, CA, SPIE Volume 3676, 278-282 (March 1999).

    39. David S. Fryer, Juan J. dePablo, and Paul Nealey, Local Thermal Analysis of Reaction and the Glass Transition in Exposed Resist, Part of the SPIE Conference on Emerging Lithographic Technologies III, Santa Clara, CA, SPIE Volume 3676, 473-477 (March 1999).

    40. B. S. Bollepalli and F. Cerrina, On the Computation of Reflected Images from Extreme Ultra Violet Masks, Part of the SPIE Conference on Emerging Lithographic Technologies III, Santa Clara, CA, SPIE Volume 3676, 587-597 (March 1999).

    41. H. H. Solak, Y. Vladimirsky, F. Cerrina, B. Lai, W. Yun, Z. Cai, P. Ilinski, D. Legnini, and W. Rodrigues, Measurement of Strain in Al-Cu Interconnect Lines with X-ray Microdiffraction, Journal of Applied Physics 86 (2), 884-890 (July 15, 1999).

    42. R. A. Bosch, Focusing of Infrared Edge and Synchrotron Radiation, Nuclear Instruments and Methods in Physics Research A 431, 320-333 (1999).

    43. S. Banerjee, W. L. O’Brien, and B. P. Tonner, Unusual Magnetic Phases in MnCo Ultrathin Alloy Films, Journal of Magnetism and Magnetic Materials 198-199, 267-269 (1999).

    44. K. Simon, O. Vladimirsky, Y. Vladimirsky, and F. Cerrina, Overlay Budget Analysis for the 100 nm Device Generation, Microelectronic Engineering 46 (1-4), 457-460 (1999).

    45. Srinivas B. Bollepalli and Franco Cerrina, Computation of Reflected Images From EUV Masks, Microelectronic Engineering 46 (1-4), 443-447 (1999).

    46. Manfred O. Krause and C. Denise Caldwell, Photoexcitation Processes in the Halogen Atoms, JASRI Proceedings, 201-211 (March 1999).

    47. M. R. Norman, M. Randeria, H. Ding, and J. C. Campuzano, Photoelectron Escape Depth and Inelastic Secondaries in High-Temperature Superconductors, Physical Review B 59 (17), 11191-11192 (May 1, 1999).

    48. G. W. Canning, M. L. Suominen Fuller, G. M. Bancroft, M. Kasrai, J. N. Cutler, G. De Stasio, and B. Gilbert, Spectromicroscopy of Tribological Films From Engine Oil Additives. Part I. Films from ZDDP’s, Tribology Letters 6 (3-4), 159-169 (1999).

    49. Z. H. Lu, T. Tyliszczak, P. Broderson, A. P. Hitchcock, J. B. Webb, H. Tang, and J. Bardwell, Local Microstructures of Si in GaN Studied by X-ray Absorption Spectroscopy, Applied Physics Letters 75 (4), 534-536 (July 26, 1999).

    50. I. Vobornik, R. Gatt, T. Schmauder, B. Frazer, R. J. Kelley, C. Kendziora, M. Grioni, M. Onellion, and G. Margaritondo, The Symmetry of the Order Parameter in Highly Overdoped Bi2Sr2CaCu2O8+x, Physica C 317-318, 589-591 (May 1, 1999).

    51. T. K. Sham and I. Coulthard, Edge-Jump Inversion in the Si Ð 3,2 –Edge Optical XAFS of Porous Silicon, Journal of Synchrotron Radiation 6, 215-216 (May 1, 1999).

    52. Z. Zou, Y. F. Hu, T. K. Sham, H. H. Huang, G. Q. Xu, C. S. Seet, and L. Chan, XAFS Studies of AI/TiNx Films on Si (100) at the Al K- and Ð 3,2 –Edge, Journal of Synchrotron Radiation 6, 524-525 (May 1, 1999).

    53. S. J. Naftel and T. K. Sham, Co Ð 3,2 –Edge and Multi-Detection Channel XAFS Studies of Co-Si Interactions, Journal of Synchrotron Radiation 6, 526-528 (May 1, 1999).

    54. Y. –J. Zhu, I. Coulthard, and T. K. Sham, XAFS Studies of Rh Nanostructures on Porous Silicon, Journal of Synchrotron Radiation 6, 529-531 (May 1, 1999).

    55. J. Mesot, M. R. Norman, H. Ding, M. Randeria, J. C. Campuzano, A. Paramekanti, H. M. Fretwell, A. Kaminski, T. Takeuchi, T. Yokoya, T. Sato, T. Takahashi, T. Mochiku and K. Kadowaki, Superconducting Gap Anisotropy and Quasiparticle Interactions: A Doping Dependent Photoemission Study, Physical Review Letters 83 (4), 840-843 (July 26, 1999).

    56. Géraldine Sarret, Jacques Connan, Masoud Kasrai, Laurent Eybert-Bérard and G. Michael Bancroft, Characterization of Sulfur K- and Ð -Edge XANES Spectroscopy, Journal of Synchrotron Radiation 6 (3), 670-672 (May 1, 1999).

    57. Masoud Kasrai, Matthew Vasiga, Marina Suominen Fuller, G. Michael Bancroft, and Kim Fyfe, Study of the Effects of Ca Sulfonate on Antiwear Film Formation by X-ray Absorption Spectroscopy Using Synchrotron Radiation, Journal of Synchrotron Radiation 6 (3), 719-721 (May 1, 1999).

    58. Greg Canning, Masoud Kasrai, G. Michael Bancroft and David Andrew, Study of the Interaction Between Antiwear, Extreme Pressure and Rust Inhibitor Agents in the Formation of Protective Films by X-ray Absorption Spectroscopy, Journal of Synchrotron Radiation 6 (3), 740-742 (May 1, 1999).

    59. I. Coulthard and T. K. Sham, Luminescence from Porous Silicon: an Optical X-ray Absorption Fine Structures Study at the Si L3.2-Edge, Solid State Communications 110 (4), 203-208 (March 31, 1999).

    60. J. J. Paggel, T. Miller, and T. –C. Chiang, Temperature Dependent Complex Band Structure and Electron-Phonon Coupling in Ag, Physical Review Letters 83 (7), 1415-1418 (August 16, 1999).

    61. F. Z. Chen and C. Y. Robert Wu, High-Resolution Photoabsorption and Photoionization Spectra of C2H4 and C2D4, Journal of Physics B: Atomic, Molecular and Optical Physics 32 (13), 3283-3293 (July 14, 1999).

    62. J. –S. Kang, C. G. Olson, M. Hedo, Y. Inada, E. Yamamoto, Y. Haga, Y. Onuki, S. K. Kwon and B. I. Min, Photoemission Study of an ƒ-electron Superconductor: CeRu2, Physical Review B 60 (8), 5348-5353 (August 15, 1999).

    63. W. J. Antel, Jr., F. Perjeru, and G. R. Harp, Spin Structure at the Interface of Exchange Biased FeMn/Co Bilayers, Physical Review Letters 83 (7), 1439-1442 (August 16, 1999).

    64. D. N. McIlroy, Daqing Zhang, Robert M. Cohen, J. Wharton, Yongjun Gen, M. Grant Norton, Gelsomina De Stasio Ben Gilbert, L. Perfetti, J. H. Streiff, B. Broocks and Jeanne L. McHale, Electronic and Dynamic Studies of Boron Carbide Nanowires, Physical Review B 60 (7), 4874-4879 (August 15, 1999).

    65. K. N. Altmann, W. O’Brien, D. J. Seo, F. J. Himpsel, J. E. Ortega, A. Naermann, P. Segovia, A. Mascaraque, and E. G. Michel, Spin-Polarized Quantum Well States, Journal of Electron Spectroscopy and Related Phenomena 101-103, 367-370 (1999).

    66. S. B. Whitfield, S. Hallman, M. O. Krause, C. D. Caldwell, and R. D. Cowan, Determination of the Fine-Structure Properties of the 2p Subshell of Atomic Chlorine, Physical Review A 60 (3), R1747-R1750 (September 1999).

    67. John J. Neville, Tolek Tyliszczak, and Adam P. Hitchcock, Photofragmentation of OCS at the S 1s Edge, Journal of Electron Spectroscopy and Related Phenomena 101-103 (June 1999), 119-124.

    68. Ronald G. Cavell and Astrid Jurgensen, Chemical Shifts in P-1’s Photoabsorption Spectra of Gaseous Phosphorus Compounds, Journal of Electron Spectroscopy and Related Phenomena 101-103 (June 1999), 125-129.

    69. J. J. Paggel, T. Miller and T. –C. Chiang, Angle-Resolved Photoemission From Atomic-Layer-Resolved Quantum Well States in Ag/Fe(100), Journal of Electron Spectroscopy and Related Phenomena 101-103 (June 1999), 271-275.

    70. J. E. Ortega, A. Närrmann, K. N. Altmann, W. O’Brien, D. J. Seo, F. J. Himpsel, P. Segovia, A. Mascaraque, and E. G. Michel, Short Wavelength, Spin-polarized Quantum-well States in High Quality Cu Films on FCC-Co(100), Journal of Magnetism and Magnetic Materials 203, 126-128 (1999).

    71. W. Yun, B. Lai, A. A. Krasnoperova, E. Di Fabrizio, Z. Cai, F. Cerrina, Z. Chen, M. Gentili, and E. Gluskin, Development of Zone Plates with a Blazed Profile for Hard X-ray Applications, Review of Scientific Instruments 70 (9), 3537-3541 (September 1999).

    72. K. H. Kim, J. –S. Kang, C. K. Lee, and C. G. Olson, The Electronic Structures of Epitaxial CrSi2 Film Prepared on Si(111) Substrate, Applied Surface Science 150 (1-4), 8-12 (August 11, 1999).

    73. J. Jiménez-Mier, S. Schaphorst, C. D. Caldwell and M. O. Krause, Auger Decay o;f the 1s ? np (n = 2-6) Resonances in Beryllium, Journal of Physics B: Atomic, Molecular and Optical Physics 32 (17), 4301-4307 (September 14, 1999).

    74. H. H. Solak, D. He, W. Li, S. Singh-Gasson, F. Cerrina, B. H. Sohn, X. M. Yang, and P. Nealey, Exposure of 38 nm Period Grating Patterns with Extreme Ultraviolet Interferometric Lithography, Applied Physics Letters 75 (15), 2328-2330 (October 11, 1999).

    75. T. E. Kidd, T. Miller, and T. –C. Chiang, Core Level Analysis of the Surface Charge Density Wave Transition in Sn/Ge (111), Physical Review Letters 83 (14), 2789-2792 (October 4, 1999).

    76. J. A. Fedchak and J. E. Lawler, Absolute UV and Vacuum UV Oscillator Strengths for Ni ? ? ?, The Astrophysical Journal 523, 734-738 (October 1, 1999).

    77. A. Jurgensen, N. Kosugi, and R. G. Cavell, The Sulphur 2p Photoabsorption Spectrum of NSF3, Chemical Physics 247 (3), 445-452 (September 1, 1999).

    78. A. J. Arko, P. S. Riseborough, A. B Andrews, J. J. Joyce, A. N. Tahvildar-Zadeh, and M. Jarrell, Photoelectron Spectroscopy in Heavy Fermion Systems: Emphasis on Single Crystals, Handbook on the Physics and Chemistry of Rare Earths, 26, 265-382 (1999).

    79. J. C. Campuzano, H. Ding, M. R. Norman, H. M. Fretwell, M. Randeria, A. Kaminski, J. Mesot, T. Takeuchi, T. Sato, T. Yokoya, T. Takahashi, T. Mochiku, K. Kadowaki, P. Guptasarma, D. G. Hinks, Z. Konstantinovic, Z. Z. Li, and H. Raffy, Electronic Spectra and Their Relation to the (Electronic Spectra and Their Relation to the (Electronic Spectra and Their Relation to the (p, p) Collective Mode in High-Tc Superconductors, Physical Review Letters 83 (18), 3709 – 3712 (November 1, 1999).

    80. Y.-D. Chuang, A. D. Gromko, D. S. Dessau,1 Y. Aiura, Y. Yamaguchi, K. Oka,2 A. J. Arko, J. Joyce, H. Eisaki, S. I. Uchida, K. Nakamura, and Yoichi Ando, Reexamination of the Electronic Structure of Bi2Sr2CaCu2O8+* 8+* 8+* 8+* and Bi2Sr2Cu1O6+6+6+6+* : Electronlike Portions of the Fermi Surface and Depletion of Spectral Weight near M, Physical Review Letters 83 (18), 3717-3720 (November 1,1999).

    81. W. J. Antel, Jr., M. M. Schwickert, Tao Lin, W. L. O’Brien, and G. R. Harp, Induced Ferromagnetism and Anisotropy of Pt Layers in Fe/Pt(001) Multilayers, Physical Review B 60 (18), 12933-12940 (November 1, 1999-II).

    82. J. –S. Kang, C. G. Olson, J. H. Jung, S. T. Lee, T. W. Noh, and B. I. Min, Temperature-Dependent Resonant Photoemission Study of the Metallic and Charge-Ordered Phases of Pr1-xSrxMnO3, Physical Review B 60 (19), 13257-13260 (November 15, 1999-I).

    83. Jingeun Wu, G. Michael Bancroft, Richard J. Puddephatt, Y. F. Hu, Xiaorong Li, and K. H. Tan, Photoelectron Spectra of Trimethylphosphine-Substituted Tungsten Carbonyls: Ligand Field Effects, Ligand Additivity Effects, and Core-Valence Ionization Correlations, Inorganic Chemistry 38 (21), 4688-4695 (October 18, 1999).

    84. L. Que, Y. B. Gianchandi, and F. Cerrina, Mechanical Characterization of Electron-Beam Resist Using Micromachined Structures, Journal of Vacuum Science Technology B 17 (6), 2719-2722 (Nov/Dec 1999).

    85. H. H. Solak, D. He, W. Li and F. Cerrina, Nanolithography Using Extreme Ultraviolet Lithography Interferometry: 19 NM Lines and Spaces, Journal of Vacuum Science Technology B 17 (6), 3052-3057 (Nov/Dec 1999).

    86. Mumit Khan, Geng Han, Srinivas B. Bollepalli, Franco Cerrina, and Juan Maldonado, Extension of X-ray Lithography to 50 NM With a Harder Spectrum, Journal of Vacuum Science Technology B 17 (6), 3326-3432 (Nov/Dec 1999).

    87. Bing Lu, James W. Taylor, Franco Cerrina, Choi Pheng Soo, and Antony J. Bourdillon, Study of Acid Diffusion in a Positive Tone Chemically Amplified Resist Using an On-Wafer Imaging Technique, Journal of Vacuum Science Technology B 17 (6), 3345-3350 (Nov/Dec 1999).

    88. D. He, H. Solak, W. Li and F. Cerrina, Extreme Ultraviolet and X-ray Resist: Comparison Study, Journal of Vacuum Science Technology B 17 (6), 3379-3383 (Nov/Dec 1999).

    89. Srinivas B. Bollepalli, M. Khan, and Franco Cerina, Image Formation in Extreme Ultraviolet Lithography and Numerical Aperture Effects, Journal of Vacuum Science Technology B 17 (6), 2992-2997 (Nov/Dec 1999).

    90. Z. H. Lu, T. Tyliszczak, A. P. Hitchcock, and M. W. C. Dharma-Wardana, Structure of the C1-Passivated Ge (111) Surface Determined Using X-ray Absorption and First Principles Calculations, Surface Science 442 (1), L948-L952 (November 10, 1999).

    91. David S. Fryer, Srinivas Bollepali, Juan J. de Pablo, and Paul F. Nealy, Study of Acid Diffusion in Resist Near the Glass Transition Temperature, Journal of Vacuum and Science Technology B 17 (6), 3351-3355 (Nov/Dec 1999).

    92. A. R. Pawloski, J. A. Torres, P. F. Nealey, and J. J. de Pablo, Applications of Molecular Modeling in Nanolithography, Journal of Vacuum and Science Technology B 17 (6), 3371-3378 (Nov/Dec 1999).

    93. Geoffrey W. Reynolds, James W. Taylor, and Cameron J. Brooks, Direct Measurement of X-ray Mask Sidewall Roughness and Its Contribution to the Overall Sidewall Roughness of Chemically Amplified Resist Features, Journal of Vacuum and Science Technology B 17 (6), 3420-3425 (Nov/Dec 1999).

    94. Geoffrey W. Reynolds and James W. Taylor, Correlation of Atomic Force Microscopy Sidewall Roughness Measurements With Scanning Electron Microscopy Line-edge Roughness Measurements on Chemically Amplified Resists Exposed by X-ray Lithography, Journal of Vacuum and Science Technology B 17 (6), 2723-2729 (Nov/Dec 1999).

    95. M. Grioni, I. Vobornik, F. Zwick, G. Margaritondo, High-Resolution Photoemission in Low-Dimensional Conductors and Superconductors, Journal of Electron Spectroscopy and Related Phenomena 100 (1-3), 313-329 (1999).

    96. D. –A. Luh, T. Miller, and T. –C. Chiang, Self-Normalizing Methods of Photoelectron Holography Applied to As/Si (111), Physical Review B 60 (24) , 16722-16729 (15 December 1999-II).

    97. Yuli Vladimirsky, Antony Bourdillon, Olga Vladimirsky, Wenlong Jiang, and Quinn Leonard, Demagnification in Proximity X-ray Lithography and Extensibility to 25 NM by Optimizing Fresnel Diffraction, Journal of Physics D: Applied Physics 32 (22), L114 – L118 (November 21, 1999).

    98. F. J. Himpsel, Magnetic Quantum Wells, Journal of Physics Condensed Matter 11 ( ), 9483-9494 (November, 1999).

    99. W. S. Trzeciak, M. A. Green, and the SRC Staff, Beam Stability Studies and Improvements at Aladdin, IEEE, Proceedings of the 1999 Particle Accelerator conference, New York, 2391-2393 (1999).

    100. M. L. Furst, R. M. Graves, A. Hamilton, L. R. Hughey, R. P. Madden, R. E. Vest, W. S. Trzeciak, R. A. Bosch, L. Greenler, P. Robl, and D. Wahl, The Conversion of Surf II To Surf III, IEEE, Proceedings of the 1999 Particle Accelerator conference, New York, 2388-2390 (1999).

    101. T. E. May, R. A. Bosch and R. L. Julian, Infrared Edge Radiation Beamline at Aladdin, IEEE, Proceedings of the 1999 Particle Accelerator conference, New York, 2394-2396 (1999).

    102. R. A. Bosch, Computation of Flux into the Aladdin Infrared Beamline, IEEE, Proceedings of the 1999 Particle Accelerator conference, New York, 2397-2399 (1999).

    103. M. A. Green, W. R. Winter, M. Thikim, C. A. Baumann, M. V. Fisher, G. C. Rogers, D. E. Eisert, W. S. Trzeciak, and R. A. Bosch, Design, Testing and Commissioning of an Electromagnetic Undulator for SRC, IEEE, Proceedings of the 1999 Particle Accelerator conference, New York, 2659-2661 (1999).

    104. G. D. Feke, S. J. Bukofsky, D. Hessman, Q.Wu, R. D. Grober, B. Lu, P. M. Dentlinger, and J. W. Taylor, On-Wafer Imaging of the Photoacid Distribution in Chemically Amplified Photoresists, in Digest of the VII’th Connecticut Microelectronics & Optoelectronics Consortium (CMOC) Symposium, T1-1 – T1-4 (March 1999).

    105. S. Haffner, C. G. Olson, and D. W. Lynch, Evidence for Replicate 5p Core Levels in Photoelectron Spectra of Eu Metal Due to Nonconstant Kinetic-energy Resonant Auger Decay, Physical Review B 60 (24), 16346-16349 (December 15, 1999-II).

    106. David W. Lynch and C. G. Olson, Photoemission Studies of High-Temperature Superconductors, Cambridge Studies in Low Temperature Physics Series, Cambridge University Press 1999, (Book).

    107. G. W. Reynolds and J. W. Taylor, Comparison of Measured Sidewall Roughness for Positive-tone Chemically Amplified Resists Exposed by X-ray Lithography, SPIE 3678 (1), 573-581 (March 15-17, 1999)

    108. L. Yang, Y. Vladimirsky, and J. W. Taylor, Fabrication of X-ray Phase Masks for Sub-70nm Imaging, SPIE 3875, 202-209 (September 20-21, 1999).

    109. Géraldine Sarret, Jacques Connan, Masoud Kasrai, G. Michael Bancroft, Armelle Charrié-Duhaut, Sylvie Lemoine, Pierre Adam, Pierre Adam, Pierre Albrecht, and Laurent Eybert-Bérard, Chemical Forms of Sulfur in Geological and Archeological Asphaltenes from Middle East, France, and Spain Determined by Sulfur K-and L-edge X-ray Absorption Near-edge Structure Spesctroscopy, Geochimica et Cosmochimica Acta 63 (22), 3767-3779 (1999).

    110. Charles R. Szmanda, Robert L. Brainard, Joseph F. Mackevich, Akira Awaji, Tsutomo Tanaka, Yutaka Yamada, John Bohland, Serge Tedesco, Bernard Dal’Zotto, Wilhelm Bruenger, Michael Torkler, Wolfgang Fallmann, Hans Loeschner, Rainer Kaesmaier, Paul M. Nealey and Adam R. Pawloski, Measuring Acid Generation Efficiency in Chemically Amplified Resists with All Three Beams, Journal of Vacuum Science and Technology B 17 (6), 3356-3361 (Nov/Dec 1999).

    111. Xiao M. Yang, Richard D. Peters, Tae K. Kim, and Paul F. Nealey, Patterning of Self-Assembled Monolayers with Lateral Dimensions of 0.15 m m Using Advanced Lithography, Journal of Vacuum Science and Technology B 17 (6), 33203-3207 (Nov/Dec 1999).

    112. S. P. Farrell and M. E. Fleet, Evolution of Local Electronic Stucture in cubic Mg1-c> Fec S by S K-edge XANES Spectroscopy, Solid State Communications 113 (2), 69-72 (November 30, 1999).

    113. J. N. Cutler, J. H. Sanders, P. J. John, G. De Stasio, B. Gilbert, and K. Tan, Chemical Characterization of Antiwear Films Generated by Tris-[p-(Perfuoroalkylether)Phenyl] Phosphine Using X-ray Absorption Spectroscopy, Wear 236 (1-2), 165-178 (December 1999).

    114. J. E. Lawler, S. D. Bergeson, J. A. Fedchak, and K. L. Mullman, VUV f-Values of Astrophysical Interest from High Sensitivity Absorption Spectroscopy on Atomic Ions, Physica Scripta T83, 11-18 (1999).

    115. M. E. Fleet and S. Muthupari, Coordination of Boron in Alkali Borosilicate Glasses Using XANES, Journal of Non-Crystalline Solids 225, 233-241 (1999).

    116. P. S. Bromberg, K. M. Gough, M. Ogg, M. R. Del Bigio, and R. Julian, Synchrotron FTIR Microspectroscopy of Alzheimer’s Diseased Brain tissue at the SRC Beamline, Proceedings of 44th SPIE Conference, Volume 3775, 118-126 (1999).

    117. D. S. Dessau, Y. –D Chuang, A. D. Gromko, Y. Aiura, Y. Yamaguchi, K. Oka, A. J. Arko, J. Joyce, H. Eisaki, S. I. Uchida, K. Nakamura, and Yoichi Ando, A Re-Examination of the Electronic Structure and Fermi Surface of BSCCO, International Journal of Modern Physics B 13 (29, 30, & 31), 3597-3600 (1999).

    118. J. Sankar, T. K. Sham and R. J. Puddephatt, Low Temperature Chemical Vapor Deposition of Ruthenium and Ruthenium Dioxide on Polymer Surface, Journal of Materials Chemistry 9, 2439-2444 (1999).

    119. Jingxi Sun, F. J. Himpsel, A. B. Ellis, and T. F. Kuech, In Situ Passivation of GAAS By Thermal Nitridation Using Metalorganic Vapor Phase Epetaxy, Material Research Society Proceedings 573, 15-20 (1999).

    120. A. P. Hitchcock, T. Tyliszczak, Z. H. Lu, P. Brodersen, and M. W. C. Dharma-Wardana, Structure of Chemically Passivated Semiconductor Surfaces Determined Using X-ray Absorption Spectroscopy, Material Research Society Proceedings 573, 31-42 (1999).Electronic Spectra and Their Relation to the (Electronic Spectra and Their Relation to the (p, p) Collective Mode in High-Tc Superconductors, Physical Review Letters 83 (18), 3709 – 3712 (November 1, 1999).

    121. John F. Lehmann, Stephen G. Urguhart, Laura E. Ennis, Adam P. Hitchcock, Ken Hatano, Shilpi Gupta, and Michael K. Denk, Core Excitation Spectroscopy of Stable Cyclic Diaminocarbenes, -Silylenes, and –Germylenes, Organometallics 18, 1862-1872 (1999).

    122. F. Zwick, H. Berger, M. Grioni, G. Margaritondo and M. Onellion, Photoemission Study of Organic and Inorganic CDW-Systems, Journal of Physics IV France 9, Pr10-347 – Pr10-350 (1999).

    123. K. N. Altmann, J. A. Con Foo, F. J. Himpsel, J. F. Kelly, M. G. Lagally, J. F. Mackay, W. L. O’ Brien, J. E. Ortega, and D. Y. Petrovytkh, Connection Between Structure and Electronic Properties in Epitaxial Magnetic Layers, Matials Research Society 570, 141-149 (1999).

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    125. K. N. Altmann, D. Y. Petrovykh, and F. J. Himpsel, High Resolution Photoemission Study of the Spin-Dependent Band Structure of Permalloy and Ni, Surface Science Spectra 6 (4), 255-260 (1999).

    126. J. –S. Kang and C. G. Olson, Electronic Structures of the Heusler Compounds XMnSb (X= Ni, Pd, Pt) Using Photoemission Spectroscopy, Surface Science Spectra 6 (4), 261-267 (1999).

    127. R. M. Lemor, M. B. Kruger, D. M. Wieliczka, J. R. Swafford, and P. Spencer, Spectroscopic and Morphologic Characterization of the Dentin/Adhesive Interface, Journal of Biomedical Optics 4 (1), 22-27 (January 1999).

    128. S. J. Naftel, A. Bzowski, and T. K. Sham, Study of the Electronic Structure of Au-B Bimetallics Using X-ray Photoelectron Spectroscopy (XPS) and X-ray Absorption Near-Edge Structure (XANES), Journal of Alloys and Compounds 283 (1-2), 5-11 (February 1, 1999).

    129. M. R. Norman, H. Ding, H. Fretwell, M. Randeria, and J. C. Campuzano, Extraction of the Electron Self-Energy from Angle-Resolved Photoemission Data: Application to Bi2Sr2CaCu2O8+x, Physical Review B 60 (10), 7585-7590 (September 1, 1999).

    130. W. J. Dressick, C. S. Dulcey, S. L. Brandow, H. Witschi, and P. F. Nealey,Proximity X-Ray Lithography of Siloxane and Polymer Films Containing Benzyl Chloride Functional Groups, Journal of Vacuum  Science & Technology A, 17 (4), 1432-1440 (July/Aug 1999).

    131. J. Mesot, M. R. Norman, H. Ding, M. Randeria, J. C. Campuzano, A. Paramekanti, H. M. Fretwell, A. Kaminski, T. Takeuchi, T. Yokoya, T. Sato, T. Takahashi, T. Mochiku, and K. Kadowaki, BSCCO Superconductors: Hole-Like Fermi Surface and Doping Dependence of the Gap Function, Journal of Low Temperature Physics 117 (3&4), 365-369  (November 1999).